Defect Density and Poisson Yield e^(−A·D0)
This lesson is part of the course
In this lesson
You turn six months of falling defect density into expected defects per die, Poisson die yield, good dies per wafer and the wafers to start for 50,000 good chips.
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Lessons in this course
- Wafer Area and Gross Dies per Wafer (with the Edge-Loss Term) Locked
- Defect Density and Poisson Yield e^(−A·D0) Locked
- Murphy and Negative-Binomial Yield vs Poisson (with a Yield Curve) Locked
- Cost per Good Die: Wafer Cost ÷ Good Dies Locked
- Test and Packaging Yield: Cost per Shipped Chip Locked
- Die-Size Shrink Scenario: Is the New Node Cheaper per Chip? Locked
- Binning: Speed-Grade Shares and Revenue per Wafer Month Locked
- Fab Utilisation and Wafer Starts per Month Locked