Murphy and Negative-Binomial Yield vs Poisson (with a Yield Curve)
This lesson is part of the course
In this lesson
You compare three classic yield models for eight die sizes at the same defect density and chart how yield falls as dies get bigger.
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Lessons in this course
- Wafer Area and Gross Dies per Wafer (with the Edge-Loss Term) Locked
- Defect Density and Poisson Yield e^(−A·D0) Locked
- Murphy and Negative-Binomial Yield vs Poisson (with a Yield Curve) Locked
- Cost per Good Die: Wafer Cost ÷ Good Dies Locked
- Test and Packaging Yield: Cost per Shipped Chip Locked
- Die-Size Shrink Scenario: Is the New Node Cheaper per Chip? Locked
- Binning: Speed-Grade Shares and Revenue per Wafer Month Locked
- Fab Utilisation and Wafer Starts per Month Locked